Taipei Medical University

A B C D E F G H I J K L M N O P Q R S T U V W X Y Z
Yang WL
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------>insert_date=20051206
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------>journal_name=SOLID-STATE ELECTRONICS
------>paper_name=Barrier Capability of TaNx Films Deposited by Different Nitrogen Flow Rate Against Cu Diffusion in Cu/TaNx/n+-p Junction Diodes
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------>authors2=Wu WF
------>authors3=Liu DG
------>authors4=Wu CC
------>authors5=Ou KL
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------>authors=Yang WL
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------>publish_year=2001
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A B C D E F G H I J K L M N O P Q R S T U V W X Y Z